|
| next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 1 of 14 found articles
| Title: |
Carrier profiling in Si-implanted gallium nitride by Scanning Capacitance Microscopy |
| Author: |
Lamhamdi, M. Cayrel, F. Bazin, A.E. Collard, E. Alquier, D. |
| Appeared in: |
Nuclear instruments and methods in physics research. Section B, Beam interactions with materials and atoms |
| Paging: | Volume 275 (2012) nr. C pages 4 p. |
| Year: |
2012 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 1 of 14 found articles
| next >> |