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Difference of soft error rates in SOI SRAM induced by various high energy ion species |
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Titel: |
Difference of soft error rates in SOI SRAM induced by various high energy ion species |
Auteur: |
Abo, Satoshi Masuda, Naoyuki Wakaya, Fujio Lohner, Tivadar Onoda, Shinobu Makino, Takahiro Hirao, Toshio Ohshima, Takeshi Iwamatsu, Toshiaki Oda, Hidekazu Takai, Mikio |
Verschenen in: |
Nuclear instruments and methods in physics research. Section B, Beam interactions with materials and atoms |
Paginering: |
Jaargang 273 (2012) nr. C pagina's 4 p. |
Jaar: |
2012 |
Inhoud: |
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Uitgever: |
Elsevier B.V. |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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