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Raman investigation of incident N-, Xe-ions induced effects in ZnO thin films |
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Titel: |
Raman investigation of incident N-, Xe-ions induced effects in ZnO thin films |
Auteur: |
Zhiguang, Wang Hang, Zang Kongfang, Wei Jianrong, Sun Cunfeng, Yao Tielong, Shen Yizhun, Ma Lilong, Pang Yabin, Zhu |
Verschenen in: |
Nuclear instruments and methods in physics research. Section B, Beam interactions with materials and atoms |
Paginering: |
Jaargang 269 (2011) nr. 9 pagina's 5 p. |
Jaar: |
2011 |
Inhoud: |
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Uitgever: |
Elsevier B.V. |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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