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Recharging processes, radiation induced strain and changes of OH− bands under H+ ion implantation in Ti doped lithium niobate |
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Title: |
Recharging processes, radiation induced strain and changes of OH− bands under H+ ion implantation in Ti doped lithium niobate |
Author: |
Kumar, P. Moorthy Babu, S. Bhaumik, I. Ganesamoorthy, S. Karnal, A.K. Kumar, Praveen Rodrigues, G.O. Sulania, I. Kanjilal, D. Pandey, A.K. Raman, R. |
Appeared in: |
Nuclear instruments and methods in physics research. Section B, Beam interactions with materials and atoms |
Paging: |
Volume 268 (2010) nr. 2 pages 6 p. |
Year: |
2010 |
Contents: |
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Publisher: |
Elsevier B.V. |
Source file: |
Elektronische Wetenschappelijke Tijdschriften |
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