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HRXRD, AFM and optical study of damage created by swift heavy ion irradiation in GaN epitaxial layers |
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Titel: |
HRXRD, AFM and optical study of damage created by swift heavy ion irradiation in GaN epitaxial layers |
Auteur: |
Sathish, N. Dhamodaran, S. Pathak, A.P. Ghanashyam Krishna, M. Khan, S.A. Avasthi, D.K. Pandey, A. Muralidharan, R. Li, G. Jagadish, C. |
Verschenen in: |
Nuclear instruments and methods in physics research. Section B, Beam interactions with materials and atoms |
Paginering: |
Jaargang 256 (2007) nr. 1 pagina's 7 p. |
Jaar: |
2007 |
Inhoud: |
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Uitgever: |
Elsevier B.V. |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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