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                                       Details for article 182 of 233 found articles
 
 
  Quantitative trace element analysis with sub-micron lateral resolution
 
 
Title: Quantitative trace element analysis with sub-micron lateral resolution
Author: Reinert, Tilo
Spemann, Daniel
Morawski, Markus
Arendt, Thomas
Appeared in: Nuclear instruments and methods in physics research. Section B, Beam interactions with materials and atoms
Paging: Volume 249 (2006) nr. 1-2 pages 4 p.
Year: 2006
Contents:
Publisher: Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 182 of 233 found articles
 
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