In situ analysis of cracks in structural materials using synchrotron X-ray tomography and diffraction
Titel:
In situ analysis of cracks in structural materials using synchrotron X-ray tomography and diffraction
Auteur:
Steuwer, A. Edwards, L. Pratihar, S. Ganguly, S. Peel, M. Fitzpatrick, M.E. Marrow, T.J. Withers, P.J. Sinclair, I. Singh, K.D. Gao, N. Buslaps, T. Buffière, J.-Y.
Verschenen in:
Nuclear instruments and methods in physics research. Section B, Beam interactions with materials and atoms