|
Ion-cut of Si facilitated by interfacial defects of Si substrate/epitaxial layer grown by molecular-beam epitaxy |
|
|
|
Title: |
Ion-cut of Si facilitated by interfacial defects of Si substrate/epitaxial layer grown by molecular-beam epitaxy |
Author: |
Shao, Lin Lee, J.K. Höchbauer, T. Nastasi, M. Thompson, Phillip E. Rusakova, I. Seo, H.W. Chen, Q.Y. Liu, J.R. Chu, Wei-Kan |
Appeared in: |
Nuclear instruments and methods in physics research. Section B, Beam interactions with materials and atoms |
Paging: |
Volume 242 (2006) nr. 1-2 pages 3 p. |
Year: |
2006 |
Contents: |
|
Publisher: |
Elsevier B.V. |
Source file: |
Elektronische Wetenschappelijke Tijdschriften |
|
|
|
|