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                                       Details for article 76 of 99 found articles
 
 
  Radiation damage microstructures in silicon and application in position sensitive charged particle detection
 
 
Title: Radiation damage microstructures in silicon and application in position sensitive charged particle detection
Author: Jakšić, M.
Medunić, Z.
Bogovac, M.
Skukan, N.
Appeared in: Nuclear instruments and methods in physics research. Section B, Beam interactions with materials and atoms
Paging: Volume 231 (2005) nr. 1-4 pages 5 p.
Year: 2005
Contents:
Publisher: Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 76 of 99 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands