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                                       Details for article 33 of 87 found articles
 
 
  Etched ion tracks in silicon oxide and silicon oxynitride as charge injection or extraction channels for novel electronic structures
 
 
Title: Etched ion tracks in silicon oxide and silicon oxynitride as charge injection or extraction channels for novel electronic structures
Author: Fink, D.
Petrov, A.V.
Hoppe, K.
Fahrner, W.R.
Papaleo, R.M.
Berdinsky, A.S.
Chandra, A.
Chemseddine, A.
Zrineh, A.
Biswas, A.
Faupel, F.
Chadderton, L.T.
Appeared in: Nuclear instruments and methods in physics research. Section B, Beam interactions with materials and atoms
Paging: Volume 218 (2004) nr. C pages 7 p.
Year: 2004
Contents:
Publisher: Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 33 of 87 found articles
 
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