|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 16 of 20 found articles
| Title: |
Roughness in GaN/InGaN films and multilayers determined with Rutherford backscattering |
| Author: |
Barradas, N.P. Alves, E. Pereira, S. Shvartsman, V.V. Kholkin, A.L. Pereira, E. O'Donnell, K.P. Liu, C. Deatcher, C.J. Watson, I.M. Mayer, M. |
| Appeared in: |
Nuclear instruments and methods in physics research. Section B, Beam interactions with materials and atoms |
| Paging: | Volume 217 (2004) nr. 3 pages 19 p. |
| Year: |
2004 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 16 of 20 found articles
| << previous | next >> |