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                                       Details for article 72 of 75 found articles
 
 
  X-ray grazing incidence study of inhomogeneous strain relaxation in Si/SiGe wires
 
 
Title: X-ray grazing incidence study of inhomogeneous strain relaxation in Si/SiGe wires
Author: Hesse, A.
Zhuang, Y.
HolĂ˝, V.
Stangl, J.
Zerlauth, S.
Schäffler, F.
Bauer, G.
Darowski, N.
Pietsch, U.
Appeared in: Nuclear instruments and methods in physics research. Section B, Beam interactions with materials and atoms
Paging: Volume 200 (2003) nr. C pages 6 p.
Year: 2003
Contents:
Publisher: Elsevier Science B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 72 of 75 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands