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Journal description
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Details for article 72 of 185 found articles
| Title: |
Heavy ion induced damage and annealing processes in silicon |
| Author: |
Bubb, I.F. Chivers, D.J. Liu, J.R. Pogany, A.P. Short, K.T. Wagenfeld, H.K. Williams, J.S. |
| Appeared in: |
Nuclear instruments and methods in physics research. Section B, Beam interactions with materials and atoms |
| Paging: | Volume 2 (1984) nr. 1-3 pages 5 p. |
| Year: |
1984 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 72 of 185 found articles
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