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                                       Details for article 100 of 115 found articles
 
 
  Synchrotron radiation micro-X-ray fluorescence analysis: A tool to increase accuracy in microscopic analysis
 
 
Title: Synchrotron radiation micro-X-ray fluorescence analysis: A tool to increase accuracy in microscopic analysis
Author: Adams, F
Appeared in: Nuclear instruments and methods in physics research. Section B, Beam interactions with materials and atoms
Paging: Volume 199 (2003) nr. C pages 7 p.
Year: 2003
Contents:
Publisher: Elsevier Science B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 100 of 115 found articles
 
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