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Journal description
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Details for article 22 of 35 found articles
| Title: |
On the formation of concentration profiles by low-energy ion bombardment and sputter depth profiling |
| Author: |
Zexian, Cao Oechsner, Hans |
| Appeared in: |
Nuclear instruments and methods in physics research. Section B, Beam interactions with materials and atoms |
| Paging: | Volume 170 (2000) nr. 1-2 pages 9 p. |
| Year: |
2000 |
| Contents: | |
| Publisher: |
Elsevier Science B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 22 of 35 found articles
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