|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 24 of 128 found articles
| Title: |
Depth profile of chemical species in multiple doped trimethylsilane film on Si (100) surfaces by low energy Ar ions |
| Author: |
Wang, Paul W Bater, S |
| Appeared in: |
Nuclear instruments and methods in physics research. Section B, Beam interactions with materials and atoms |
| Paging: | Volume 141 (1998) nr. 1-4 pages 6 p. |
| Year: |
1998 |
| Contents: | |
| Publisher: |
Elsevier Science B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 24 of 128 found articles
| << previous | next >> |