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Journal description
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Details for article 6 of 25 found articles
| Title: |
Application of secondary neutral mass spectrometry in low-energy sputtering yield measurements |
| Author: |
Bhattacharjee, S. Zhang, J. Shutthanandan, V. Ray, P.K. Shivaparan, N.R. Smith, R.J. |
| Appeared in: |
Nuclear instruments and methods in physics research. Section B, Beam interactions with materials and atoms |
| Paging: | Volume 129 (1997) nr. 1 pages 7 p. |
| Year: |
1997 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 6 of 25 found articles
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