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Journal description
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Details for article 113 of 119 found articles
| Title: |
Thin film depth profiling using simultaneous particle backscattering and nuclear resonance profiling |
| Author: |
Barradas, N.P. Mateus, R. Fonseca, M. Reis, M.A. Lorenz, K. Vickridge, I. |
| Appeared in: |
Nuclear instruments and methods in physics research. Section B, Beam interactions with materials and atoms |
| Paging: | Volume 268 (2010) nr. 11-12 pages 4 p. |
| Year: |
2010 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 113 of 119 found articles
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