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                                       Details for article 19 of 43 found articles
 
 
  Improved current drivability with back-gate bias for elevated source and drain structured FD-SOI SiGe MOSFET
 
 
Title: Improved current drivability with back-gate bias for elevated source and drain structured FD-SOI SiGe MOSFET
Author: Choi, Hoon
Moon, Kyoho
Lee, Chulgu
Cho, Il Hwan
Hong, Sang Jeen
Appeared in: Microelectronic engineering
Paging: Volume 86 (2009) nr. 11 pages 5 p.
Year: 2009
Contents:
Publisher: Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 19 of 43 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands