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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
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Details for article 64 of 74 found articles
| Title: |
Simulation of focused ion beam milling |
| Author: |
Müller, K.P. Weigmann, U. Burghause, H. |
| Appeared in: |
Microelectronic engineering |
| Paging: | Volume 5 (1986) nr. 1-4 pages 9 p. |
| Year: |
1986 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 64 of 74 found articles
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