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Journal description
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Details for article 5 of 74 found articles
| Title: |
Asymmetric dielectric breakdown behavior in MgO based magnetic tunnel junctions |
| Author: |
Lim, J.H. Raghavan, N. Mei, S. Lee, K.H. Noh, S.M. Kwon, J.H. Quek, E. Pey, K.L. |
| Appeared in: |
Microelectronic engineering |
| Paging: | Volume 178 (2017) nr. C pages 308-312 |
| Year: |
2017 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 5 of 74 found articles
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