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Journal description
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Details for article 37 of 74 found articles
| Title: |
Hole trapping in amorphous HfO2 and Al2O3 as a source of positive charging |
| Author: |
Strand, Jack Dicks, Oliver A. Kaviani, Moloud Shluger, Alexander L. |
| Appeared in: |
Microelectronic engineering |
| Paging: | Volume 178 (2017) nr. C pages 235-239 |
| Year: |
2017 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 37 of 74 found articles
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