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Journal description
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Details for article 2 of 74 found articles
| Title: |
Analysis of the substrate bias effect on the interface trapped charges in junctionless nanowire transistors through low-frequency noise characterization |
| Author: |
Doria, Rodrigo Trevisoli Trevisoli, Renan de Souza, Michelly Barraud, Sylvain Vinet, Maud Faynot, Olivier Pavanello, Marcelo Antonio |
| Appeared in: |
Microelectronic engineering |
| Paging: | Volume 178 (2017) nr. C pages 17-20 |
| Year: |
2017 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2 of 74 found articles
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