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                                       Details for article 100 of 187 found articles
 
 
  Influences of bottom electrode TaN on electrical characteristics for metal–HfO2–metal capacitors
 
 
Title: Influences of bottom electrode TaN on electrical characteristics for metal–HfO2–metal capacitors
Author: Kang, Tsung-Kuei
Chang, Chia-Tung
Lin, Cheng-Li
Wu, Wen-Fa
Appeared in: Microelectronic engineering
Paging: Volume 86 (2009) nr. 10 pages 5 p.
Year: 2009
Contents:
Publisher: Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 100 of 187 found articles
 
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