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                                       Details for article 90 of 135 found articles
 
 
  Plasma-engineered Si−SiO2 interfaces: monolayer nitrogen atom incorporation by low-temperature remote plasma-assisted oxidation in N2O
 
 
Title: Plasma-engineered Si−SiO2 interfaces: monolayer nitrogen atom incorporation by low-temperature remote plasma-assisted oxidation in N2O
Author: Koh, K.
Niimi, H.
Lucovsky, G.
Appeared in: Surface & coatings technology
Paging: Volume 98 (1998) nr. 1-3 pages 5 p.
Year: 1998
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 90 of 135 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands