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                                       Details for article 23 of 118 found articles
 
 
  Etching characteristics of Si and SiO2 with a low energy argon/hydrogen d.c. plasma source
 
 
Title: Etching characteristics of Si and SiO2 with a low energy argon/hydrogen d.c. plasma source
Author: Strass, A
Hansch, W
Bieringer, P
Neubecker, A
Kaesen, F
Fischer, A
Eisele, I
Appeared in: Surface & coatings technology
Paging: Volume 97 (1997) nr. 1-3 pages 5 p.
Year: 1997
Contents:
Publisher: Elsevier Science S.A.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 23 of 118 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands