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Journal description
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Details for article 19 of 100 found articles
| Title: |
Depth profiles, projected ranges, and secondary ion mass spectrometry relative sensitivity factors for more than 50 elements from hydrogen to uranium implanted into metals |
| Author: |
Wilson, R.G. Stevie, F.A. Lux, G.E. Kirschbaum, C.L. Frank, S. Pallix, J. |
| Appeared in: |
Surface & coatings technology |
| Paging: | Volume 51 (1992) nr. 1-3 pages 6 p. |
| Year: |
1992 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 19 of 100 found articles
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