|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 2 of 25 found articles
| Title: |
Characterization of a Cr2O3 scale formed on chromium with implanted yttrium ions by advanced electron microscopy |
| Author: |
Gil, A. Kryshtal, O. Brylewski, T. Czyrska-Filemonowicz, A. |
| Appeared in: |
Surface & coatings technology |
| Paging: | Volume 368 (2019) nr. C pages 232-242 |
| Year: |
2019 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2 of 25 found articles
| << previous | next >> |