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Journal description
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Details for article 19 of 121 found articles
| Title: |
Characterization of Er-doped AlN films prepared by RF magnetron sputtering |
| Author: |
Ge, Shuwei Zhang, Bizhuang Yang, Chengtao |
| Appeared in: |
Surface & coatings technology |
| Paging: | Volume 358 () nr. C pages 404-408 |
| Year: |
2019 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 19 of 121 found articles
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