|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 113 of 122 found articles
| Title: |
TEM characterization of Cu self-annealing and direct proof of pinhole formation mechanism in a Cu film |
| Author: |
Ho, C.E. Chen, C.C. Yang, C.H. Lee, P.T. Hsieh, W.Z. Wu, Y.S. |
| Appeared in: |
Surface & coatings technology |
| Paging: | Volume 350 () nr. C pages 1010-1019 |
| Year: |
2018 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 113 of 122 found articles
| << previous | next >> |