Digital Library
Close Browse articles from a journal
 
<< previous    next >>
     Journal description
       All volumes of the corresponding journal
         All issues of the corresponding volume
           All articles of the corresponding issues
                                       Details for article 113 of 122 found articles
 
 
  TEM characterization of Cu self-annealing and direct proof of pinhole formation mechanism in a Cu film
 
 
Title: TEM characterization of Cu self-annealing and direct proof of pinhole formation mechanism in a Cu film
Author: Ho, C.E.
Chen, C.C.
Yang, C.H.
Lee, P.T.
Hsieh, W.Z.
Wu, Y.S.
Appeared in: Surface & coatings technology
Paging: Volume 350 () nr. C pages 1010-1019
Year: 2018
Contents:
Publisher: Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 113 of 122 found articles
 
<< previous    next >>
 
 Koninklijke Bibliotheek - National Library of the Netherlands