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Journal description
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Details for article 39 of 48 found articles
| Title: |
Residual stress measurement in DLC films deposited by PBIID method using Raman microprobe spectroscopy |
| Author: |
Miki, Yasuhiro Nishimoto, Akio Sone, Takumi Araki, Yoshiji |
| Appeared in: |
Surface & coatings technology |
| Paging: | Volume 283 (2015) nr. C pages 7 p. |
| Year: |
2015 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 39 of 48 found articles
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