Characterization of microstructural, mechanical and optical properties of TiO 2 layers deposited by GIMS and PMS methods
Titel:
Characterization of microstructural, mechanical and optical properties of TiO 2 layers deposited by GIMS and PMS methods
Auteur:
Skowronski, L. Zdunek, K. Nowakowska-Langier, K. Chodun, R. Trzcinski, M. Kobierski, M. Kustra, M.K. Wachowiak, A.A. Wachowiak, W. Hiller, T. Grabowski, A. Kurpaska, L. Naparty, M.K.