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Journal description
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Details for article 5 of 26 found articles
| Title: |
Correlated extended X-ray absorption fine structure and transmission electron microscopy studies the microstructure of low friction Ti–C–N films |
| Author: |
Liu, D.G. Pan, Y.J. Bai, W.Q. Tu, J.P. |
| Appeared in: |
Surface & coatings technology |
| Paging: | Volume 266 (2015) nr. C pages 5 p. |
| Year: |
2015 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 5 of 26 found articles
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