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Journal description
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Details for article 20 of 40 found articles
| Title: |
Focused ion beam four-slot milling for Poisson's ratio and residual stress evaluation at the micron scale |
| Author: |
Sebastiani, M. Eberl, C. Bemporad, E. Korsunsky, A.M. Nix, W.D. Carassiti, F. |
| Appeared in: |
Surface & coatings technology |
| Paging: | Volume 251 (2014) nr. C pages 11 p. |
| Year: |
2014 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 20 of 40 found articles
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