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                                       Details for article 2 of 12 found articles
 
 
  Correlation between mass-spectrometer measurements and thin film characteristics using dcMS and HiPIMS discharges
 
 
Title: Correlation between mass-spectrometer measurements and thin film characteristics using dcMS and HiPIMS discharges
Author: Ferrec, A.
Keraudy, J.
Jacq, S.
Schuster, F.
Jouan, P.-Y.
Djouadi, M.A.
Appeared in: Surface & coatings technology
Paging: Volume 250 (2014) nr. C pages 5 p.
Year: 2014
Contents:
Publisher: Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 2 of 12 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands