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Journal description
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Details for article 123 of 123 found articles
| Title: |
X-ray diffraction analysis of the structure and residual stresses of W/Cu multilayers |
| Author: |
Girault, B. Villain, P. Le Bourhis, E. Goudeau, P. Renault, P.-O. |
| Appeared in: |
Surface & coatings technology |
| Paging: | Volume 201 (2006) nr. 7 pages 5 p. |
| Year: |
2006 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 123 of 123 found articles
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