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Details for article 27 of 36 found articles
| Title: |
Residual stresses in (Zr,Hf)N films (up to 11.9 at.% Hf) measured by X-ray diffraction using experimentally calculated XECs |
| Author: |
Atar, E. Sarioglu, C. Cimenoglu, H. Kayali, E.S. |
| Appeared in: |
Surface & coatings technology |
| Paging: | Volume 191 (2005) nr. 2-3 pages 7 p. |
| Year: |
2005 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 27 of 36 found articles
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