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                                       Details for article 5 of 18 found articles
 
 
  Compositional depth profile analysis of coatings on hard disks by X-ray photoelectron spectroscopy and imaging
 
 
Title: Compositional depth profile analysis of coatings on hard disks by X-ray photoelectron spectroscopy and imaging
Author: Gao, Jianxia
Liu, Erjia
Butler, David Lee
Zeng, Aiping
Appeared in: Surface & coatings technology
Paging: Volume 176 (2003) nr. 1 pages 10 p.
Year: 2003
Contents:
Publisher: Elsevier Science B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 5 of 18 found articles
 
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