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Journal description
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Details for article 2 of 137 found articles
| Title: |
A comparative study of electronic properties of the defects introduced in p-Si: (i) During electron beam deposition of Ti/Mo, (ii) by proton irradiation, and (iii) by electron irradiation |
| Author: |
Das, A.G.M. Nyamhere, C. Auret, F.D. Hayes, M. |
| Appeared in: |
Surface & coatings technology |
| Paging: | Volume 203 (2009) nr. 17-18 pages 4 p. |
| Year: |
2009 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2 of 137 found articles
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