|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 109 of 154 found articles
| Title: |
Polarized micro-Raman spectroscopy for studying stresses in as-grown and tensile-tested diamond films |
| Author: |
Gries, T. Vandenbulcke, L. Simon, P. Canizares, A. |
| Appeared in: |
Surface & coatings technology |
| Paging: | Volume 202 (2008) nr. 11 pages 5 p. |
| Year: |
2008 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 109 of 154 found articles
| << previous | next >> |