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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
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Details for article 134 of 139 found articles
| Title: |
The use of Raman spectroscopy to identify strain and strain relaxation in strained Si/SiGe structures |
| Author: |
Dobrosz, P. Bull, S.J. Olsen, S.H. O'Neill, A.G. |
| Appeared in: |
Surface & coatings technology |
| Paging: | Volume 200 (2005) nr. 5-6 pages 6 p. |
| Year: |
2005 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 134 of 139 found articles
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