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Journal description
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Details for article 41 of 49 found articles
| Title: |
RBS depth profiling and optical characterization of multilayers of TiO2 (20 nm) and Ge (15 nm) |
| Author: |
Hussain, Mirza Sajjad Mehmood, Mazhar Ahmad, Jamil Tanvir, M. Tauseef Khan, A. Faheem Ali, Turab Mahmood, Arshad |
| Appeared in: |
Materials chemistry and physics |
| Paging: | Volume 139 (2013) nr. 1 pages 10 p. |
| Year: |
2013 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 41 of 49 found articles
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