Digital Library
Close Browse articles from a journal
 
<< previous    next >>
     Journal description
       All volumes of the corresponding journal
         All issues of the corresponding volume
           All articles of the corresponding issues
                                       Details for article 14 of 35 found articles
 
 
  Design, fabrication and testing of a low cost Trunk Diameter Variation (TDV) measurement system based on an ATmega 328/P microcontroller
 
 
Title: Design, fabrication and testing of a low cost Trunk Diameter Variation (TDV) measurement system based on an ATmega 328/P microcontroller
Author: Dangare, P.
Mhizha, T.
Mashonjowa, E.
Appeared in: Computers and electronics in agriculture
Paging: Volume 148 () nr. C pages 197-206
Year: 2018
Contents:
Publisher: Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 14 of 35 found articles
 
<< previous    next >>
 
 Koninklijke Bibliotheek - National Library of the Netherlands