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Journal description
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Details for article 7 of 18 found articles
| Title: |
Eigenstructure tracking analysis for revealing noise pattern and local rank in instrumental profiles: application to transmittance and absorbance IR spectroscopy |
| Author: |
Toft, Jostein Kvalheim, Olav M. |
| Appeared in: |
Chemometrics and intelligent laboratory systems |
| Paging: | Volume 19 (1993) nr. 1 pages 9 p. |
| Year: |
1993 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 7 of 18 found articles
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