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Journal description
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Details for article 178 of 513 found articles
| Title: |
Electron impact ionization of tetramethylsilane (TMS) |
| Author: |
Basner, R Foest, R Schmidt, M Sigeneger, F Kurunczi, P Becker, K Deutsch, H |
| Appeared in: |
International journal of mass spectrometry and ion processes |
| Paging: | Volume 153 (1996) nr. 1 pages 14 p. |
| Year: |
1996 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 178 of 513 found articles
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