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Journal description
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Details for article 312 of 409 found articles
| Title: |
Secondary ion mass spectrometry (SIMS) of metal surfaces under oxygen. II. Sputtering yields |
| Author: |
Klöppel, K.D. Brudny, M.M. Von Bünau, G. |
| Appeared in: |
International journal of mass spectrometry and ion processes |
| Paging: | Volume 68 (1986) nr. 1-2 pages 10 p. |
| Year: |
1986 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 312 of 409 found articles
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