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Defect engineering design and electrical breakdown model improve dielectric properties and reliability of rare-earth doped BaTiO3-based ceramics |
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Titel: |
Defect engineering design and electrical breakdown model improve dielectric properties and reliability of rare-earth doped BaTiO3-based ceramics |
Auteur: |
Zhang, Zhourui Tan, Junhui Huang, Xiong Yang, Jun Shanming ke, Fu, Zhenxiao Cao, Xiuhua Wang, Pengfei Zhang, Lei Yu, Shuhui Sun, Rong |
Verschenen in: |
Ceramics international |
Paginering: |
Jaargang 51 () nr. 1 pagina's 705-715 |
Jaar: |
2025 |
Inhoud: |
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Uitgever: |
Elsevier Ltd and Techna Group S.r.l. |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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