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                                       Details for article 83 of 198 found articles
 
 
  Film thickness effect on texture and residual stress sign transition in sputtered TiN thin films
 
 
Title: Film thickness effect on texture and residual stress sign transition in sputtered TiN thin films
Author: Xi, Yeting
Gao, Kewei
Pang, Xiaolu
Yang, Huisheng
Xiong, Xiaotao
Li, Hong
Volinsky, Alex A.
Appeared in: Ceramics international
Paging: Volume 43 (2017) nr. 15 pages 11992-11997
Year: 2017
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 83 of 198 found articles
 
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