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                                       Details for article 6 of 10 found articles
 
 
  Looking at the nanoscale: scanning near-field optical microscopy
 
 
Title: Looking at the nanoscale: scanning near-field optical microscopy
Author: De Serio, M.
Zenobi, R.
Deckert, V.
Appeared in: TrAC trends in analytical chemistry. [Regular ed.]
Paging: Volume 22 (2003) nr. 2 pages 8 p.
Year: 2003
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 6 of 10 found articles
 
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