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                                       Details for article 7 of 15 found articles
 
 
  Measurement and continuous improvement of software reliability throughout software life-cycle 1 This research is supported in part by NSF CAREER award CCR-9733588, Nortel Technology, and IBM Toronto Lab. 1
 
 
Title: Measurement and continuous improvement of software reliability throughout software life-cycle 1 This research is supported in part by NSF CAREER award CCR-9733588, Nortel Technology, and IBM Toronto Lab. 1
Author: Tian, Jeff
Appeared in: Journal of systems and software
Paging: Volume 47 (1999) nr. 2-3 pages 7 p.
Year: 1999
Contents:
Publisher: Elsevier Science Inc.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 7 of 15 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands